TY  - BOOK
AU  -  Sharma,  Ashok  A K
TI  -  Semi conductor memories: Technology testing reliability
SN  - 4288
U1  -  621.38152  SHA-S 
PB  -  Prentice - Hall of India, Pvt. ltd., New Delh
KW  -  Semiconductor devices; Electronics engineering; Applied physics
ER  -